Published July 2013
| Version v1
Journal article
Effect of chlorine doping on CdTe thin films
- 1. Dept. of Physics and Engineering, Moldova State Univ., Mateevici str. 60, Chisinau, MD-2009, Chisinau (Moldova, Republic of)
- 2. Faculty of Physics, 'Alexandru Ioan Cuza' Univ., Carol I blvd. 11, Iasi, 700506, Iasi (Romania)
Description
This paper analyzes the effect of chlorine treatment on the structure and resistance of CdTe layers. The morphology, chemical composition, and structure were studied using scanning electron microscopy (SEM), energy dispersive X-ray analysis (EDX), and X-ray diffraction (XRD). Both non-activated and activated CdTe layers are polycrystalline with an average grain size being three times higher after chlorine activation and thermal treatment. All CdTe thin layers regardless of the treatment temperature have a cubic crystal structure. (authors)
Availability note (English)
Available online at http://sfm.asm.md/moldphys/2013/vol12/n34/index.htmlAdditional details
Identifiers
Publishing Information
- Journal Title
- Moldavian Journal of the Physical Sciences
- Journal Volume
- 12
- Journal Issue
- 3-4
- Journal Page Range
- p. 249-254
- ISSN
- 1810-648X
INIS
- Country of Publication
- Moldova, Republic of
- Country of Input or Organization
- Moldova, Republic of
- INIS RN
- 46056393
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CADMIUM COMPOUNDS; CADMIUM TELLURIDES; CHEMICAL COMPOSITION; CHLORINE; CRYSTAL STRUCTURE; DOPED MATERIALS; ELECTRIC CONDUCTIVITY; GRAIN SIZE; LAYERS; MICROSTRUCTURE; MORPHOLOGY; PHOTOSENSITIVITY; SCANNING ELECTRON MICROSCOPY; TELLURIDES; TELLURIUM COMPOUNDS; THIN FILMS; X-RAY DIFFRACTION
- Descriptors DEC
- CADMIUM COMPOUNDS; CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; ELECTRICAL PROPERTIES; ELECTRON MICROSCOPY; ELEMENTS; FILMS; HALOGENS; MATERIALS; MICROSCOPY; MICROSTRUCTURE; NONMETALS; PHYSICAL PROPERTIES; SCATTERING; SENSITIVITY; SIZE; TELLURIDES; TELLURIUM COMPOUNDS
Optional Information
- Notes
- 10 refs., 1 tab., 7 figs.