Sensitivity of high energy PIXE bulk analysis

The PIXE analysis with high energy α-particles with Esub(α) = 30 MeV as projectiles can be used with high accuracy for bulk analysis of nearly any object. It is shown, that another advantage of this method is its high sensitivity of better than 100 ppm for every element with atomic number Z > 20. These properties of the PIXE analysis method make it a very good tool for quick non-destructive bulk analysis simultaneously for all elements with Z > 20 down the concentrations of approximately < 100 ppm. (Auth.)