Published September 30, 2008
| Version v1
Journal article
Quasi-one-dimensional In atomic chains on Si(1 1 1) at low temperature studied by reflection high-energy positron diffraction and scanning tunneling microscopy
- 1. Advanced Science Research Center, Japan Atomic Energy Agency, 1233 Watanuki, Takasaki, Gunma 370-1292 (Japan)
- 2. Faculty of Science, Japan Women's University, 2-8-1 Mejirodai, Bunkyo-ku, Tokyo 112-8681 (Japan)
Description
We have investigated a quasi-one-dimensional structure of Si(1 1 1)-8 x 2-In surface using reflection high-energy positron diffraction (RHEPD) and scanning tunneling microscopy (STM). From the RHEPD rocking curve analyses, we confirmed the formation of the In hexagon structure proposed by Gonzalez et al. [C. Gonzalez, F. Flores, J. Ortega, Phys. Rev. Lett. 96 (2006) 136101]. Furthermore, we found that the empty-state STM image at 44 K is consistent with that calculated with the optimum hexagon structure by the RHEPD analyses
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apsusc.2008.02.010Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2008.02.010;
- PII
- S0169-4332(08)00251-1;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 254
- Journal Issue
- 23
- Journal Page Range
- p. 7733-7736
- ISSN
- 0169-4332
- CODEN
- ASUSEE
Conference
- Title
- 9. international conference on atomically controlled surfaces, interfaces and nanostructures
- Acronym
- ASCIN-9
- Dates
- 11-15 Nov 2007
- Place
- Tokyo (Japan)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40032176
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- INDIUM; NEUTRON DIFFRACTION; POSITRONS; REFLECTION; SCANNING TUNNELING MICROSCOPY; SILICON; SURFACES; TEMPERATURE RANGE 0013-0065 K
- Descriptors DEC
- ANTILEPTONS; ANTIMATTER; ANTIPARTICLES; COHERENT SCATTERING; DIFFRACTION; ELEMENTARY PARTICLES; ELEMENTS; FERMIONS; LEPTONS; MATTER; METALS; MICROSCOPY; SCATTERING; SEMIMETALS; TEMPERATURE RANGE
Optional Information
- Copyright
- Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.