Published September 30, 2008 | Version v1
Journal article

Quasi-one-dimensional In atomic chains on Si(1 1 1) at low temperature studied by reflection high-energy positron diffraction and scanning tunneling microscopy

  • 1. Advanced Science Research Center, Japan Atomic Energy Agency, 1233 Watanuki, Takasaki, Gunma 370-1292 (Japan)
  • 2. Faculty of Science, Japan Women's University, 2-8-1 Mejirodai, Bunkyo-ku, Tokyo 112-8681 (Japan)

Description

We have investigated a quasi-one-dimensional structure of Si(1 1 1)-8 x 2-In surface using reflection high-energy positron diffraction (RHEPD) and scanning tunneling microscopy (STM). From the RHEPD rocking curve analyses, we confirmed the formation of the In hexagon structure proposed by Gonzalez et al. [C. Gonzalez, F. Flores, J. Ortega, Phys. Rev. Lett. 96 (2006) 136101]. Furthermore, we found that the empty-state STM image at 44 K is consistent with that calculated with the optimum hexagon structure by the RHEPD analyses

Availability note (English)

Available from http://dx.doi.org/10.1016/j.apsusc.2008.02.010

Additional details

Identifiers

DOI
10.1016/j.apsusc.2008.02.010;
PII
S0169-4332(08)00251-1;

Publishing Information

Journal Title
Applied Surface Science
Journal Volume
254
Journal Issue
23
Journal Page Range
p. 7733-7736
ISSN
0169-4332
CODEN
ASUSEE

Conference

Title
9. international conference on atomically controlled surfaces, interfaces and nanostructures
Acronym
ASCIN-9
Dates
11-15 Nov 2007
Place
Tokyo (Japan)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
40032176
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
INDIUM; NEUTRON DIFFRACTION; POSITRONS; REFLECTION; SCANNING TUNNELING MICROSCOPY; SILICON; SURFACES; TEMPERATURE RANGE 0013-0065 K
Descriptors DEC
ANTILEPTONS; ANTIMATTER; ANTIPARTICLES; COHERENT SCATTERING; DIFFRACTION; ELEMENTARY PARTICLES; ELEMENTS; FERMIONS; LEPTONS; MATTER; METALS; MICROSCOPY; SCATTERING; SEMIMETALS; TEMPERATURE RANGE

Optional Information

Copyright
Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.