Published January 1, 2009 | Version v1
Journal article

A study on the secondary electron emission from Na-ion-doped MgO films in relation to the discharge characteristics of plasma display panels

  • 1. Department of Electrical Engineering and Computer Science, Korea Advanced Institute of Science and Technology, 373-1 Guseong-Dong, Yuseong-Gu, Daejeon 305-701 (Korea, Republic of)
  • 2. Department of Advanced Materials Engineering, Korea Polytechnic University, 2121 Jeongwang-Dong, Shihung-Si, Gyeonggi-Do 429-793 (Korea, Republic of)
  • 3. Department of Information Display, Kyung Hee University, Hoegi-Dong, Dongdaemun-Gu, Seoul 130-701 (Korea, Republic of)

Description

Using a sol-gel precursor, Na-ion-doped MgO was prepared and applied to alternative current plasma display panels (ac-PDP). The cathodoluminescence spectra showed that the F+ center was increased as the concentration of Na+ was increased. Numerous pores were found on the printed MgO surface and seemed to give higher memory margin of ac-PDP compared to an electron beam-evaporated MgO film. All doped MgO showed higher secondary electron emission than printed pure MgO, likely owing to the O defect states of MgO. In addition, this result indicated the operational memory margin of the ac-PDP was directly proportional to the grade of surface charging

Availability note (English)

Available from http://dx.doi.org/10.1016/j.tsf.2008.08.176

Additional details

Identifiers

DOI
10.1016/j.tsf.2008.08.176;
PII
S0040-6090(08)00996-6;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
517
Journal Issue
5
Journal Page Range
p. 1706-1709
ISSN
0040-6090
CODEN
THSFAP

Optional Information

Copyright
Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.