Dimpling of cadmium telluride samples for transmission electron microscopy

A technique for preparing thin sections in CdTe samples for transmission electron microscopy by a method of mechanical dimpling combined with chemical etching has been investigated. The dimpling rates and surface morphologies of dimpled (100) CdTe samples as a function of pressure, abrasive size and viscosity are presented. This technique produces dimpled samples of well controlled geometries and surface morphologies and offers the advantage of a high dimpling rate and the precise determination of the dimple position. The disadvantage of this technique is that a final application of chemical etching or atom milling is still required to produce electron thin sections