RF magnetron sputtered TiNiCu shape memory alloy thin film
Creators
Description
Shape memory alloys (SMAs) offer a unique combination of novel properties, such as shape memory effect, super-elasticity, biocompatibility and high damping capacity, and thin film SMAs have the potential to become a primary actuating mechanism for micro-actuators. In this study, TiNiCu films were successfully prepared by mix sputtering of a Ti55Ni45 target with a separated Cu target. Crystalline structure, residual stress and phase transformation properties of the TiNiCu films were investigated using X-ray diffraction (XRD), differential scanning calorimeter (DSC), and curvature measurement methods. Effects of the processing parameters on the film composition, phase transformation and shape-memory effects were analyzed. Results showed that films prepared at a high Ar gas pressure exhibited a columnar structure, while films deposited at a low Ar gas pressure showed smooth and featureless structure. Chemical composition of TiNiCu thin films was dependent on the DC power of copper target. DSC, XRD and curvature measurement revealed clearly the martensitic transformation of the deposited TiNiCu films. When the free-standing film was heated and cooled, a 'two-way' shape-memory effect can be clearly observed
Additional details
Identifiers
- PII
- S0921509302001302;
Publishing Information
- Journal Title
- Materials Science and Engineering. A, Structural Materials: Properties, Microstructure and Processing
- Journal Volume
- 339
- Journal Issue
- 1-2
- Journal Page Range
- p. 10-16
- ISSN
- 0921-5093
- CODEN
- MSAPE3
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38064335
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CALORIMETERS; CALORIMETRY; CHEMICAL COMPOSITION; COPPER; DAMPING; DEPOSITION; ELASTICITY; MAGNETRONS; MARTENSITE; PHASE TRANSFORMATIONS; PROCESSING; RESIDUAL STRESSES; SHAPE MEMORY EFFECT; SPUTTERING; THIN FILMS; TITANIUM ALLOYS; X-RAY DIFFRACTION
- Descriptors DEC
- ALLOYS; CARBON ADDITIONS; COHERENT SCATTERING; DIFFRACTION; ELECTRON TUBES; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; FILMS; IRON ALLOYS; MEASURING INSTRUMENTS; MECHANICAL PROPERTIES; METALS; MICROWAVE EQUIPMENT; MICROWAVE TUBES; SCATTERING; STRESSES; TRANSITION ELEMENT ALLOYS; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.