Dynamic Analysis of Recalescence Process and Interface Growth of Eutectic Fe82B17Si1 Alloy
Creators
- 1. China University of Mining and Technology, School of Material Science and Engineering (China)
- 2. Changzhou College of Information Technology, School of Mechanical and Electrical Engineering (China)
Description
By employing the glass fluxing technique in combination with cyclical superheating, the microstructural evolution of the undercooled Fe82B17Si1 alloy in the obtained undercooling range was studied. With increase in undercooling, a transition of cooling curves was detected from one recalescence to two recalescences, followed by one recalescence. The two types of cooling curves were fitted by the break equation and the Johnson–Mehl–Avrami–Kolmogorov model. Based on the cooling curves at different undercoolings, the recalescence rate was calculated by the multi-logistic growth model and the Boettinger–Coriel–Trivedi model. Both the recalescence features and the interface growth kinetics of the eutectic Fe82B17Si1 alloy were explored. The fitting results that were obtained using TEM (SAED), SEM and XRD were consistent with the changing rule of microstructures. Finally, the relationship between the microstructure and hardness was also investigated.
Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Materials Engineering and Performance
- Journal Volume
- 27
- Journal Issue
- 4
- Journal Page Range
- p. 1784-1791
- ISSN
- 1059-9495
- CODEN
- JMEPEG
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 51022344
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- BORON COMPOUNDS; DIAGRAMS; ELECTRON DIFFRACTION; EUTECTICS; GLASS; HARDNESS; INTERFACES; IRON COMPOUNDS; MICROSTRUCTURE; SCANNING ELECTRON MICROSCOPY; SILICON COMPOUNDS; SUPERHEATING; TERNARY ALLOY SYSTEMS; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION
- Descriptors DEC
- ALLOY SYSTEMS; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; HEATING; INFORMATION; MECHANICAL PROPERTIES; MICROSCOPY; SCATTERING; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2018 ASM International
- Notes
- http://www.springer-ny.com