Published April 23, 2007 | Version v1
Journal article

Investigation of Texture and Residual Stresses in Reactive Magnetron Sputtered TiN coatings on M2 Steel Substrates

  • 1. Department of Solid State Physics and Microelectronics, Faculty of Physics, University of Sofia, 5 blvd. James Bouchier, 1164 Sofia (Bulgaria)
  • 2. Institute for Nuclear Research and Nuclear Energy, 72 Tzarigradsko Chaussee, BG-1784 Sofia (Bulgaria)
  • 3. Surface Engineering Group, Department of Chemistry and Materials, Manchester Metropolitan University, Manchester M15GD (United Kingdom)

Description

The development of crystallographic texture and residual macro-stresses during the growth from 500 nm to 4000 nm of TiN films applied by reactive Closed Field Unbalanced Magnetron Sputtering (CFUBMS) on M2 tool steel at three direct target currents (Id) (namely 4, 6 and 8A) have been analyzed via X-ray diffraction

Additional details

Identifiers

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
899
Journal Issue
1
Journal Page Range
p. 631
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
6. international conference of the Balkan Physical Union
Dates
22-26 Aug 2006
Place
Istanbul (Turkey)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
39074436
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
COATINGS; CRYSTAL GROWTH; CRYSTAL STRUCTURE; FILMS; SPUTTERING; STEELS; SUBSTRATES; SURFACE COATING; TEXTURE; TITANIUM NITRIDES; X-RAY DIFFRACTION
Descriptors DEC
ALLOYS; CARBON ADDITIONS; COHERENT SCATTERING; DEPOSITION; DIFFRACTION; IRON ALLOYS; IRON BASE ALLOYS; NITRIDES; NITROGEN COMPOUNDS; PNICTIDES; SCATTERING; TITANIUM COMPOUNDS; TRANSITION ELEMENT ALLOYS; TRANSITION ELEMENT COMPOUNDS

Optional Information

Notes
(c) 2007 American Institute of Physics