Published June 1982 | Version v1
Journal article

Plasma oxidation of silicon

  • 1. Liverpool Univ. (UK). Dept. of Electrical Engineering and Electronics

Description

A brief review of the techniques used to oxide silicon in oxygen discharges is given and a series of experiments that have been carried out to identify the oxidizing species are described. There is strong evidence to suggest that the negative ion O- is responsible for the observed phenomenon. (author)

Additional details

Publishing Information

Journal Title
Plasma Phys.
Journal Volume
24
Journal Issue
6
Series
Plasma Phys.
Journal Page Range
605-614
ISSN
0032-1028

Conference

Title
8. annual conference of the Institute of Physics Plasma Physics Group.
Dates
8 - 10 Jul 1981.
Place
Swansea (UK).

INIS

Country of Publication
United Kingdom
Country of Input or Organization
United Kingdom
INIS RN
14730231
Subject category
S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ELECTRIC ARCS; ELECTRIC DISCHARGES; GLOW DISCHARGES; OXIDATION; OXYGEN; OXYGEN IONS; SILICON
Descriptors DEC
CHARGED PARTICLES; CHEMICAL REACTIONS; CURRENTS; ELECTRIC CURRENTS; ELEMENTS; IONS; NONMETALS; SEMIMETALS