Published 1987
| Version v1
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Energy-dispersive X-ray fluorescence analysis of cerium in ferrosilicon
Description
The cerium was determined in ferrosilicon samples by energy-dispersive X-ray fluorescence techniques (XRF) techniques, with a secondary target of gadolinium. The methods employed were: comparison and linear regression with reference materials with cerium concentration between 0.4 and 1.0%. The samples were prepared in the form of pellets and the analytical results are reported as an average of five determinations with a confidence limits at 95% probability. (Author)
Abstract (Spanish)
Se determino cerio en muestras de ferrosilicio utilizando la tecnica de fluorescencia de rayos X dispersivo en energias con un blanco secundario de gadolineo. Los metodos utilizados fueron: comparacion y regresion lineal con materiales de referencia de concentracion de cerio entre 0,4 y 1,0%. Las muestras se prepararon en forma de pastillas y los resultados analiticos se informan como promedio de cinco determinaciones con un intervalo de confianza al nivel del 95%. (Autor)Files
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Additional details
Additional titles
- Original title (Spanish)
- Determinacion de cerio en ferrosilicio por fluorescencia de rayos X dispersivo en energias
Publishing Information
- Imprint Title
- Advances in X-ray techniques analysis. Vol. 6
- Imprint Pagination
- 243 p.
- Journal Page Range
- p. 153-156.
- Report number
- INIS-mf--11565
Conference
- Title
- 6. National seminar and 2. Latin American seminar on X-ray techniques analysis in progress (SARX '87).
- Original Conference Title
- 6. Seminario nacional
- Dates
- 9-13 Nov 1987.
- Place
- Bahia Blanca (Argentina).
INIS
- Country of Publication
- Argentina
- Country of Input or Organization
- Argentina
- INIS RN
- 21009426
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CERIUM; IRON ALLOYS; SAMPLE PREPARATION; SILICON ALLOYS; X-RAY FLUORESCENCE ANALYSIS
- Descriptors DEC
- ALLOYS; CHEMICAL ANALYSIS; ELEMENTS; METALS; NONDESTRUCTIVE ANALYSIS; RARE EARTHS; X-RAY EMISSION ANALYSIS
Optional Information
- Notes
- Imprint:Avances en analisis por tecnicas en rayos X. Vol. 6.;Sexto seminario nacional y segundo latinoamericano de analisis por tecnicas de rayos X en Bahia Blanca, 9-13 de noviembre de 1987 (SARX '87).