Measurements of diffusion lengths of a micron range by technique of nuclear spectrometry

The technique for measuring the diffusion length in the range of 0.5-50 μm and the minimal carrier lifetime of the order of several nanoseconds are proposed. The Schottky barrier structure based on 4H-SiC in the mode of reverse bias is investigated. The calibrated nonequilibrium charge size is injected by 5.4 MeV alpha particles of the natural decay in the single-particle counting mode. The application of the nuclear spectroscopy method allows to measure the nonequilibrium charge diffused in the base to the boundary of the electric field range. The charge losses arising during diffusion are calculated depending on the penetration length of particle tracks beyond the electric field range