Published September 11, 2011 | Version v1
Journal article

3D-FBK pixel sensors: Recent beam tests results with irradiated devices

  • 1. INFN Trieste and University of Udine (Switzerland)
  • 2. Bergen University (Norway)
  • 3. Bonn University (Germany)
  • 4. Calabria University (Italy)
  • 5. CERN (Switzerland)

Description

The Pixel Detector is the innermost part of the ATLAS experiment tracking device at the Large Hadron Collider, and plays a key role in the reconstruction of the primary vertices from the collisions and secondary vertices produced by short-lived particles. To cope with the high level of radiation produced during the collider operation, it is planned to add to the present three layers of silicon pixel sensors which constitute the Pixel Detector, an additional layer (Insertable B-Layer, or IBL) of sensors. 3D silicon sensors are one of the technologies which are under study for the IBL. 3D silicon technology is an innovative combination of very-large-scale integration and Micro-Electro-Mechanical-Systems where electrodes are fabricated inside the silicon bulk instead of being implanted on the wafer surfaces. 3D sensors, with electrodes fully or partially penetrating the silicon substrate, are currently fabricated at different processing facilities in Europe and USA. This paper reports on the 2010 June beam test results for irradiated 3D devices produced at FBK (Trento, Italy). The performance of these devices, all bump-bonded with the ATLAS pixel FE-I3 read-out chip, is compared to that observed before irradiation in a previous beam test.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nima.2010.12.209

Additional details

Identifiers

DOI
10.1016/j.nima.2010.12.209;
PII
S0168-9002(10)03011-1;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
650
Journal Issue
1
Journal Page Range
p. 150-157
ISSN
0168-9002
CODEN
NIMAER

Conference

Title
5. international workshop on semiconductor pixel detectors for particles and imaging
Acronym
PIXEL 2010
Dates
6-10 Sep 2010
Place
Grindelwald (Switzerland)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
44001691
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
BEAMS; CERN LHC; COLLISIONS; ELECTRODES; EQUIPMENT; IRRADIATION; LAYERS; PERFORMANCE; RADIATION DETECTORS; READOUT SYSTEMS; SENSORS; SI SEMICONDUCTOR DETECTORS; SUBSTRATES; SURFACES
Descriptors DEC
ACCELERATORS; CYCLIC ACCELERATORS; MEASURING INSTRUMENTS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; STORAGE RINGS; SYNCHROTRONS

Optional Information

Copyright
Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.