3D-FBK pixel sensors: Recent beam tests results with irradiated devices
Creators
- 1. INFN Trieste and University of Udine (Switzerland)
- 2. Bergen University (Norway)
- 3. Bonn University (Germany)
- 4. Calabria University (Italy)
- 5. CERN (Switzerland)
Description
The Pixel Detector is the innermost part of the ATLAS experiment tracking device at the Large Hadron Collider, and plays a key role in the reconstruction of the primary vertices from the collisions and secondary vertices produced by short-lived particles. To cope with the high level of radiation produced during the collider operation, it is planned to add to the present three layers of silicon pixel sensors which constitute the Pixel Detector, an additional layer (Insertable B-Layer, or IBL) of sensors. 3D silicon sensors are one of the technologies which are under study for the IBL. 3D silicon technology is an innovative combination of very-large-scale integration and Micro-Electro-Mechanical-Systems where electrodes are fabricated inside the silicon bulk instead of being implanted on the wafer surfaces. 3D sensors, with electrodes fully or partially penetrating the silicon substrate, are currently fabricated at different processing facilities in Europe and USA. This paper reports on the 2010 June beam test results for irradiated 3D devices produced at FBK (Trento, Italy). The performance of these devices, all bump-bonded with the ATLAS pixel FE-I3 read-out chip, is compared to that observed before irradiation in a previous beam test.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nima.2010.12.209Additional details
Identifiers
- DOI
- 10.1016/j.nima.2010.12.209;
- PII
- S0168-9002(10)03011-1;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 650
- Journal Issue
- 1
- Journal Page Range
- p. 150-157
- ISSN
- 0168-9002
- CODEN
- NIMAER
Conference
- Title
- 5. international workshop on semiconductor pixel detectors for particles and imaging
- Acronym
- PIXEL 2010
- Dates
- 6-10 Sep 2010
- Place
- Grindelwald (Switzerland)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44001691
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BEAMS; CERN LHC; COLLISIONS; ELECTRODES; EQUIPMENT; IRRADIATION; LAYERS; PERFORMANCE; RADIATION DETECTORS; READOUT SYSTEMS; SENSORS; SI SEMICONDUCTOR DETECTORS; SUBSTRATES; SURFACES
- Descriptors DEC
- ACCELERATORS; CYCLIC ACCELERATORS; MEASURING INSTRUMENTS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; STORAGE RINGS; SYNCHROTRONS
Optional Information
- Copyright
- Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.