Influence of residual stress on the adhesion and surface morphology of PECVD-coated polypropylene
Creators
- 1. Institute of Plastics Processing (IKV) at RWTH Aachen University, Seffenter Weg 201, 52074 Aachen (Germany)
- 2. Institute for Materials, Ruhr-University Bochum, Universitätsstraße 150, 44801 Bochum (Germany)
- 3. Institute for Experimental Physics II, Ruhr-University Bochum, Universitätsstraße 150, 44801 Bochum (Germany)
Description
The properties of plasma-enhanced chemical vapour deposition (PECVD) coatings on polymer materials depend to some extent on the surface and material properties of the substrate. Here, isotactic polypropylene (PP) substrates are coated with silicon oxide (SiOx) films. Plasmas for the deposition of SiOx are energetic and oxidative due to the high amount of oxygen in the gas mixture. Residual stress measurements using single Si cantilever stress sensors showed that these coatings contain high compressive stress. To investigate the influence of the plasma and the coatings, residual stress, silicon organic (SiOCH) coatings with different thicknesses between the PP and the SiOx coating are used as a means to protect the substrate from the oxidative SiOx coating process. Pull-off tests are performed to analyse differences in the adhesion of these coating systems. It could be shown that the adhesion of the PECVD coatings on PP depends on the coatings' residual stress. In a PP/SiOCH/SiOx-multilayer system the residual stress can be significantly reduced by increasing the thickness of the SiOCH coating, resulting in enhanced adhesion. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1361-6463/aa8798Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. D, Applied Physics
- Journal Volume
- 50
- Journal Issue
- 44
- Journal Page Range
- [10 p.]
- ISSN
- 0022-3727
- CODEN
- JPAPBE
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 49010495
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- ADHESION; CHEMICAL VAPOR DEPOSITION; COATINGS; FILMS; LAYERS; MATERIALS; MIXTURES; MORPHOLOGY; OXIDATION; PLASMA; POLYPROPYLENE; RESIDUAL STRESSES; SENSORS; SILICON OXIDES; SUBSTRATES; SURFACES; THICKNESS
- Descriptors DEC
- CHALCOGENIDES; CHEMICAL COATING; CHEMICAL REACTIONS; DEPOSITION; DIMENSIONS; DISPERSIONS; ORGANIC COMPOUNDS; ORGANIC POLYMERS; OXIDES; OXYGEN COMPOUNDS; POLYMERS; POLYOLEFINS; SILICON COMPOUNDS; STRESSES; SURFACE COATING