Published 2017 | Version v1
Book

Validation of XRD stress analyses combining in-situ tests and integrated peak processing

  • 1. Safran Landing Systems, Safran group, Inovel Parc Sud, rue Général Valérie André, Velizy-Villacoublay (France)
  • 2. LMT-Cachan, ENS Cachan/CNRS/Université Paris-Saclay, Cachan (France)
  • 3. Université Paris-Est, Institut de Recherche en Constructibilité, ESTP, Cachan (France)

Description

The surface integrity has a significant effect on the fatigue life of structural components (e.g., landing gears). To estimate sub-surface residual stresses, X-ray diffraction (XRD) is applied to a Ti5553 alloy sample in an in-situ tensile test. This material is challenging since it is made of α and β phases of different proportions, shapes and scales ranging from submicrometre to millimetre sizes. Therefore stress variations occur between grains. For millimetric probed volumes, the studied microstructure leads to shallow and noisy diffraction signals. It is shown that combing a new integrated method of diffraction peak registration and in-situ XRD measurements in tensile tests allows qualitative and quantitative results of residual stress analyses to be obtained for Ti5553 alloy samples. (author)

Availability note (English)

Also available from doi: http://dx.doi.org/10.21741/9781945291173-16
Part of:
Residual Stresses 2016 ICRS-10

Additional details

Publishing Information

Publisher
Materials Research Forum LLC
Imprint Place
Millersville, PA (United States)
ISBN
978-1-94529117-3; 978-1-94529116-6
Imprint Title
Residual Stresses 2016 ICRS-10
Imprint Pagination
638 p.
Journal Volume
2
Series
Materials Research Proceedings
Journal Page Range
p. 91-96
ISSN
2474-3941

Conference

Title
10. International Conference on Residual Stresses
Acronym
ICRS-10
Dates
3-7 Jul 2016
Place
Sydney, NSW (Australia)

INIS

Country of Publication
United States
Country of Input or Organization
Australia
INIS RN
52070981
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
FATIGUE; MICROSTRUCTURE; STRESS ANALYSIS; SURFACE PROPERTIES; TENSILE PROPERTIES; TITANIUM ALLOYS; X-RAY DIFFRACTION
Descriptors DEC
ALLOYS; COHERENT SCATTERING; DIFFRACTION; MECHANICAL PROPERTIES; SCATTERING; TRANSITION ELEMENT ALLOYS

Optional Information

Notes
11 refs., 5 figs.