Validation of XRD stress analyses combining in-situ tests and integrated peak processing
- 1. Safran Landing Systems, Safran group, Inovel Parc Sud, rue Général Valérie André, Velizy-Villacoublay (France)
- 2. LMT-Cachan, ENS Cachan/CNRS/Université Paris-Saclay, Cachan (France)
- 3. Université Paris-Est, Institut de Recherche en Constructibilité, ESTP, Cachan (France)
Description
The surface integrity has a significant effect on the fatigue life of structural components (e.g., landing gears). To estimate sub-surface residual stresses, X-ray diffraction (XRD) is applied to a Ti5553 alloy sample in an in-situ tensile test. This material is challenging since it is made of α and β phases of different proportions, shapes and scales ranging from submicrometre to millimetre sizes. Therefore stress variations occur between grains. For millimetric probed volumes, the studied microstructure leads to shallow and noisy diffraction signals. It is shown that combing a new integrated method of diffraction peak registration and in-situ XRD measurements in tensile tests allows qualitative and quantitative results of residual stress analyses to be obtained for Ti5553 alloy samples. (author)
Availability note (English)
Also available from doi: http://dx.doi.org/10.21741/9781945291173-16Additional details
Identifiers
Publishing Information
- Publisher
- Materials Research Forum LLC
- Imprint Place
- Millersville, PA (United States)
- ISBN
- 978-1-94529117-3; 978-1-94529116-6
- Imprint Title
- Residual Stresses 2016 ICRS-10
- Imprint Pagination
- 638 p.
- Journal Volume
- 2
- Series
- Materials Research Proceedings
- Journal Page Range
- p. 91-96
- ISSN
- 2474-3941
Conference
- Title
- 10. International Conference on Residual Stresses
- Acronym
- ICRS-10
- Dates
- 3-7 Jul 2016
- Place
- Sydney, NSW (Australia)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- Australia
- INIS RN
- 52070981
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- FATIGUE; MICROSTRUCTURE; STRESS ANALYSIS; SURFACE PROPERTIES; TENSILE PROPERTIES; TITANIUM ALLOYS; X-RAY DIFFRACTION
- Descriptors DEC
- ALLOYS; COHERENT SCATTERING; DIFFRACTION; MECHANICAL PROPERTIES; SCATTERING; TRANSITION ELEMENT ALLOYS
Optional Information
- Notes
- 11 refs., 5 figs.