Published October 1993
| Version v1
Journal article
Oriented growth in oxide thin film heterostructures
- 1. Purdue Univ., West Lafayette, IN (United States). School of Materials Engineering
- 2. Bell Communications Research, Red Bank, NJ (United States)
Description
In this paper, the authors report the structural analysis of La0.5Sr0.5CoO3 (LSCo) / Pb0.9La0.1Zr0.2Ti0.8O3 (PLZT) multilayers grown with and without a bismuth titanate (Bi-Ti) template onto yttria-stabilized zirconia (YSZ) coated (001) Si substrates grown by laser ablation. The tetragonal PLZT was expected to have lattice parameters of approximately a = 0.406 nm and c = 0.411 nm, and the cubic LSCo to have a lattice parameter of 0.381 nm. The Bi-Ti layer was used because, with strongly two-dimensional growth, it was expected to form with the (001) basal plane parallel to the growth surface. Such a layered structure could then provide a template for the oriented growth of any subsequent layers
Additional details
Publishing Information
- Journal Title
- Scripta Metallurgica et Materialia
- Journal Volume
- 29
- Journal Issue
- 7
- Journal Page Range
- p. 885-888.
- ISSN
- 0956-716X
- CODEN
- SCRMEX
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 25014160
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- COBALT OXIDES; CRYSTAL GROWTH; LANTHANUM ALLOYS; LEAD ALLOYS; MICROSTRUCTURE; STRONTIUM ALLOYS; THIN FILMS; TITANIUM OXIDES; ZIRCONIUM ALLOYS
- Descriptors DEC
- ALLOYS; CHALCOGENIDES; COBALT COMPOUNDS; CRYSTAL STRUCTURE; FILMS; OXIDES; OXYGEN COMPOUNDS; RARE EARTH ALLOYS; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS