Diagnostic of Soft X-ray Energy Spectrum Based on Silicon drift Detector in EAST Fully-Superconducting Tokamak
Creators
- 1. Institute of Plasma Physics, Chinese Academy of Sciences, Hefei (China)
Description
A set of diagnostic system of soft X-ray energy spectrum, based on a high performance silicon drift detector (SDD) linear array including 15 SDDs, was established for measuring the plasma soft X-ray (1-20 keV) spectra on the EAST fully-superconducting Tokamak. The diagnostic system basically views all the plasma space and can measure electron temperature under various plasma configuration conditions. The profile of electron temperature with 50 ms time-resolution and about 7 cm spatial resolution can be obtained by means of the system. It is observed that the electron temperature derived from the system is consistent with those from other diagnostic systems.In addition, the characteristic line emissions of some metallic impurities fallen in the soft X-ray energy range can also be detected by the system. (authors)
Additional details
Publishing Information
- Journal Title
- Atomic Energy Science and Technology
- Journal Volume
- 44
- Journal Issue
- 6
- Journal Page Range
- p. 757-763
- ISSN
- 1000-6931
INIS
- Country of Publication
- China
- Country of Input or Organization
- China
- INIS RN
- 43085085
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Descriptors DEI
- CONFIGURATION; ELECTRON TEMPERATURE; ENERGY SPECTRA; HT-7U TOKAMAK; KEV RANGE 10-100; PERFORMANCE; PLASMA; SI SEMICONDUCTOR DETECTORS; SILICON; SOFT X RADIATION; SPATIAL RESOLUTION; TIME RESOLUTION; X-RAY DETECTION; X-RAY SPECTRA
- Descriptors DEC
- CLOSED PLASMA DEVICES; DETECTION; ELECTROMAGNETIC RADIATION; ELEMENTS; ENERGY RANGE; IONIZING RADIATIONS; KEV RANGE; MEASURING INSTRUMENTS; RADIATION DETECTION; RADIATION DETECTORS; RADIATIONS; RESOLUTION; SEMICONDUCTOR DETECTORS; SEMIMETALS; SPECTRA; THERMONUCLEAR DEVICES; TIMING PROPERTIES; TOKAMAK DEVICES; X RADIATION
Optional Information
- Notes
- 11 figs., 16 refs.