Fixture for supporting and aligning a sample to be analyzed in an X-ray diffraction apparatus

This patent describes a fixture for aligning and supporting a sample in a X-ray beam projecting from an X-ray source to an X-ray detector mounted for rotation about a first axis for X-ray diffraction analysis of the sample. It comprises base means rotatable on the first axis and supported at a location intermediate the X-ray beam source and the X-ray detector, first and second plate means carried by and rotatable with the base means and disposed on the base means in a stacked array along the first axis and with juxtaposed planar surfaces disposed perpendicular to the first axis, and yieldable means securing the first plate means to the second plate means for urging the first plate means towards the second plate means. The fixture also comprises a boss means centrally disposed on a surface of the first plate means and extending along the first axis, and sample supporting means movably attached to the boss means for selective movement along the first axis and having an elongated receptable therein extending along the first axis for receiving and supporting a sample-containing capillary on the first axis. A selectively adjustable spacer means tilts the first plate means and the sample supporting means along at least one other axis for positioning and maintaining the sample-containing capillary on the first axis during rotation of the base means