Published May 2007 | Version v1
Journal article

Direct recoil spectroscopy of alkanethiol covered surfaces

  • 1. Centro Atomico Bariloche, CNEA, Instituto Balseiro, UNC and CONICET, Bustillo 9500, 8400 Bariloche, RN (Argentina)
  • 2. INIFTA, Departamento de Qui'mica, Universidad Nacional de La Plata, CONICET, CC. 16, Suc. 4, BI904DPI La Plata, BsAs (Argentina)
  • 3. Surface Science Western, University of Western Ontario, London, Ont, N6A 5B7 (Canada)

Description

We use time of flight direct recoil spectroscopy to study the adsorption of alkanethiols on three model surfaces: Ag(1 1 1), Au(1 1 1), and GaAs(1 1 0). The low damage imparted to the films allows following the adsorption kinetics in detail, from very low exposures up to formation of dense self-assembled films. Measurements versus sample temperature provide information about desorption processes and the final S content. A substrate roughening effect is detected after annealing the organic films grown on Ag

Additional details

Identifiers

DOI
10.1016/j.nimb.2006.12.092;
PII
S0168-583X(06)01371-1;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
258
Journal Issue
1
Journal Page Range
p. 183-188
ISSN
0168-583X
CODEN
NIMBEU

Conference

Title
16. international workshop on inelastic ion-surface collisions
Dates
17-22 Sep 2006
Place
Hernstein (Austria)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
39018400
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ADSORPTION; ANNEALING; DAMAGE; DESORPTION; FILMS; GALLIUM ARSENIDES; INFORMATION; IONS; KINETICS; SCATTERING; SPECTROSCOPY; SUBSTRATES; SURFACES; TIME-OF-FLIGHT METHOD
Descriptors DEC
ARSENIC COMPOUNDS; ARSENIDES; CHARGED PARTICLES; GALLIUM COMPOUNDS; HEAT TREATMENTS; PNICTIDES; SORPTION

Optional Information

Copyright
Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.