Studies on the stress and thermal properties of Mo/B4C and MoxC1-x/B4C multilayers
- 1. MOE Key Laboratory of Advanced Micro-structured Materials, School of Physics Science and Engineering, Tongji University, Shanghai 200092 (China)
- 2. Shanghai Synchrotron Radiation Facility, Shanghai Advanced Research Institute, Chinese Academy of Sciences, Zhangheng Road 239, Pudong District, Shanghai 201204 (China)
Description
A comparative study of Mo/B4C and MoxC1-x/B4C multilayers deposited by DC magnetron sputtering technology was presented in this paper. Using a homemade real-time stress measure instrument, the stress of two kinds of multilayers was investigated. Characterizations of the multilayers before and after annealing were performed by grazing incident and at-wavelength near-normal incident x-ray reflectivity. Experimental results show that after replacing Mo by MoxC1-x, MoxC1-x/B4C multilayers obtain relatively smaller compressive stress compared with Mo/B4C multilayers. The corresponding stress value changes from −0.99 GPa to −0.36 Gpa. MoxC1-x/B4C multilayers have also proven to have better thermal stability up to 600 °C. After repeatedly annealing from 100 °C to 600 °C, Mo/B4C multilayers had a ∼2% decrease in near-normal incident reflectivity, while MoxC1-x/B4C multilayers had a smaller 1.4% loss of reflectivity and a higher stability temperature. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/2053-1591/ab7c87Additional details
Identifiers
Publishing Information
- Journal Title
- Materials Research Express (Online)
- Journal Volume
- 7
- Journal Issue
- 3
- Journal Page Range
- [8 p.]
- ISSN
- 2053-1591
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 52107108
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ANNEALING; BORON CARBIDES; COMPARATIVE EVALUATIONS; MAGNETRONS; PRESSURE RANGE GIGA PA; REFLECTIVITY; STABILITY; STRESSES; THERMODYNAMIC PROPERTIES; X RADIATION
- Descriptors DEC
- BORON COMPOUNDS; CARBIDES; CARBON COMPOUNDS; ELECTROMAGNETIC RADIATION; ELECTRON TUBES; ELECTRONIC EQUIPMENT; EQUIPMENT; EVALUATION; HEAT TREATMENTS; IONIZING RADIATIONS; MICROWAVE EQUIPMENT; MICROWAVE TUBES; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; PRESSURE RANGE; RADIATIONS; SURFACE PROPERTIES