Published December 2018
| Version v1
Journal article
The new neutron depth profiling instrument N4DP at the Heinz Maier-Leibnitz Zentrum
- 1. Professorship of Particle Physics at Low Energies, Physics Department, Technical University of Munich, D-85748 Garching (Germany)
- 2. Central Technology Lab, Physics Department, Technical University of Munich, D-85748 Garching (Germany)
- 3. Heinz Maier-Leibnitz Zentrum (MLZ), Technical University of Munich, D-85748 Garching (Germany)
Description
The cold neutron guide of the Prompt Gamma Activation Analysis (PGAA) instrument (Revay et al. 2015) at the Heinz Maier-Leibnitz Zentrum (MLZ) provides an excellent opportunity for neutron depth profiling (NDP) due to its high collimated neutron flux. We present the concept, layout and first measurements with the new N4DP facility set-up at this beamline. A special focus is put on background analysis and instrument characterization. We present measurements of a NIST reference sample and of boron-containing float glasses which are used for neutron optical waveguides. We give an outlook concerning the ongoing development of position-resolved NDP using silicon microstrip detectors.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nima.2018.09.113Additional details
Identifiers
- DOI
- 10.1016/j.nima.2018.09.113;
- PII
- S016890021831266X;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 911
- Journal Page Range
- p. 30-36
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 53026991
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ACTIVATION ANALYSIS; BORON; COLD NEUTRONS; DEPTH; NEUTRON DETECTION; NEUTRON FLUX; NEUTRON GUIDES; RESOLUTION; SI MICROSTRIP DETECTORS; WAVEGUIDES
- Descriptors DEC
- BARYONS; CHEMICAL ANALYSIS; DETECTION; DIMENSIONS; ELEMENTARY PARTICLES; ELEMENTS; FERMIONS; HADRONS; MEASURING INSTRUMENTS; NEUTRONS; NONDESTRUCTIVE ANALYSIS; NUCLEONS; RADIATION DETECTION; RADIATION DETECTORS; RADIATION FLUX; SEMICONDUCTOR DETECTORS; SEMIMETALS; SI SEMICONDUCTOR DETECTORS
Optional Information
- Copyright
- Copyright (c) 2018 Elsevier B.V. All rights reserved.