Published May 2, 2000 | Version v1
Journal article

The nature of the 4.8 eV optical absorption band induced by vacuum-ultraviolet irradiation of glassy SiO2

Description

The controversial optical absorption band centered at 4.8 eV, which is present in nearly all irradiated silicas, was investigated. It is caused by at least two different defects: non-bridging oxygen hole center (NBOHC) and interstitial ozone (O3). Both species have absorption bands at 4.8 eV, the O3-related band is identified by its susceptibility to bleaching by 4 to 5 eV photons, by a smaller halfwidth and by its independence from the NBOHC-associated 1.9 eV photoluminescence (PL) band. The contribution of NBOHC to the 4.8 eV band is dominant in most cases, while O3 is important in F2 excimer laser-irradiated samples of oxygen-rich glassy SiO2

Additional details

Identifiers

PII
S0168583X99007922;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
166-167
Journal Issue
1-4
Journal Page Range
p. 711-715
ISSN
0168-583X
CODEN
NIMBEU

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
33049310
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ABSORPTION SPECTRA; COLOR CENTERS; GLASS; PHYSICAL RADIATION EFFECTS; SILICON OXIDES; ULTRAVIOLET RADIATION
Descriptors DEC
CHALCOGENIDES; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; ELECTROMAGNETIC RADIATION; OXIDES; OXYGEN COMPOUNDS; POINT DEFECTS; RADIATION EFFECTS; RADIATIONS; SILICON COMPOUNDS; SPECTRA; VACANCIES

Optional Information

Copyright
Copyright (c) 2000 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.