Published 1993
| Version v1
Book
X-ray dosimetry with low capacitance silicon detector
- 1. Inst. of Atomic Physics, Bucharest (Romania)
Description
The paper presents a low capacitance, low reverse current detector suited for x-ray dosimetry at room temperature. The detector is drift chamber type with transversal field collection charge carriers. Based on the low noise performance of the detector and first stage of electronics, a pocket size x-ray dose ratemeter is proposed, for 10--60 keV energy range
Additional details
Publishing Information
- Publisher
- SPIE--The International Society for Optical Engineering.
- Imprint Place
- Bellingham, WA (United States)
- ISBN
- 0-8194-1258-9
- Imprint Title
- X-ray detector physics and applications II
- Imprint Pagination
- 283 p.
- Series
- Proceedings/SPIE, Volume 2009.
- Journal Page Range
- p. 56-63.
Conference
- Title
- Annual meeting of the Society of Photo-Optical Instrumentation Engineers (SPIE).
- Dates
- 11-16 Jul 1993.
- Place
- San Diego, CA (United States).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 27045400
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- AMBIENT TEMPERATURE; DESIGN; ENERGY RESOLUTION; RESPONSE FUNCTIONS; SI SEMICONDUCTOR DETECTORS; SIZE; SOFT X RADIATION; X-RAY DOSIMETRY
- Descriptors DEC
- DOSIMETRY; ELECTROMAGNETIC RADIATION; FUNCTIONS; IONIZING RADIATIONS; MEASURING INSTRUMENTS; RADIATION DETECTORS; RADIATIONS; RESOLUTION; SEMICONDUCTOR DETECTORS; X RADIATION
Optional Information
- Secondary number(s)
- CONF-930722--.