Post-annealing temperature dependence of infrared absorption enhancement of polymer on evaporated silver films
- 1. Department of Advanced Physics, Faculty of Science and Technology, Hirosaki University, Hirosaki 036-8561 (Japan)
- 2. Nanomaterials Laboratory, National Institute for Materials Science, 1-2-1 Sengen, Tsukuba, Ibaraki 305-0047 (Japan)
Description
Infrared absorption spectra were measured at normal incidence of radiation for polymers on post-annealed silver films of 4-10 nm mass thicknesses that had been deposited in ultra high vacuum onto Si substrate surfaces. Results show that the polymer absorption intensity depends on the annealing temperature and the silver mass thickness. Results clarified that no simple relation existed, such as a negative correlation between reflectivity and the infrared absorption enhancement, even when the mass thickness was made constant and the silver particles' size and shape were changed. For infrared absorption intensity to become large, particles must be positioned discretely, but if the distance between particles is too large, absorption intensity decreases. Moreover, results verified that optimal thin-film morphology was different according to the wavelength region
Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2006.08.029;
- PII
- S0040-6090(06)01023-6;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 515
- Journal Issue
- 5
- Journal Page Range
- p. 3073-3078
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39021065
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ABSORPTION; ABSORPTION SPECTRA; ABSORPTION SPECTROSCOPY; ANNEALING; INFRARED SPECTRA; MORPHOLOGY; PARTICLE SIZE; POLYMERS; REFLECTIVITY; SILVER; SURFACES; TEMPERATURE DEPENDENCE; THICKNESS; THIN FILMS
- Descriptors DEC
- DIMENSIONS; ELEMENTS; FILMS; HEAT TREATMENTS; METALS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; SIZE; SORPTION; SPECTRA; SPECTROSCOPY; SURFACE PROPERTIES; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.