Radiation damage and deuterium trapping in deuterium ion injected beryllium

Thermal desorption of D from its ion injected Be at several temperatures was compared with microstructural evolution during irradiation and annealing to know the details of retention and desorption of the implanted D and to identify responsible traps. In the case of the irradiation at 300 K, black dot defects and very small bubbles are formed at low doses and at high doses, respectively. The bubbles grow by annealing above 573 K and act as major trapping sites for D at low doses less than 1 x 1021 ions/m2. D trapped in the bubbles finally released at around 880 K. Long and thin bubbles are developed by the irradiation at 673 K. These are responsible for high retention under the irradiation at high temperatures. (orig.)