Published 2003
| Version v1
Miscellaneous
X-ray diffraction studies of radiation defects in CdTe single crystals and epitaxial layers
- 1. Institute of Applied Problems of Mechanics and Mathematics, Lvov (Ukraine)
- 2. Ivan Franko National University, Lvov (Ukraine)
- 3. Chernivtsi National University, Chernivtsi (Ukraine)
- 4. Institute of Metallurgy and Materials Sciences, Polish Academy of Sciences, Cracow (Poland)
Description
no abstract available
Additional details
Publishing Information
- Imprint Title
- Abstracts of The European Materials Conference E-MRS 2003 Fall Meeting
- Imprint Pagination
- 287 p.
- Journal Page Range
- p. 71-72
Conference
- Title
- European Materials Conference E-MRS 2003 Fall Meeting
- Dates
- 15-19 Sep 2003
- Place
- Warsaw (Poland)
INIS
- Country of Publication
- Poland
- Country of Input or Organization
- Poland
- INIS RN
- 35101079
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- No Abstract, Conference, Non-conventional Literature
- Descriptors DEI
- ARSENIC IONS; CADMIUM COMPOUNDS; CADMIUM TELLURIDES; CHEMICAL COMPOSITION; COMPUTERIZED SIMULATION; CRYSTAL DEFECTS; DEFORMATION; DOPED MATERIALS; ION IMPLANTATION; MERCURY COMPOUNDS; MONOCRYSTALS; PHYSICAL RADIATION EFFECTS; TELLURIDES; VAPOR PHASE EPITAXY; X-RAY DIFFRACTION; X-RAY SPECTRA
- Descriptors DEC
- CADMIUM COMPOUNDS; CHALCOGENIDES; CHARGED PARTICLES; COHERENT SCATTERING; CRYSTAL GROWTH METHODS; CRYSTAL STRUCTURE; CRYSTALS; DIFFRACTION; EPITAXY; IONS; MATERIALS; RADIATION EFFECTS; SCATTERING; SIMULATION; SPECTRA; TELLURIDES; TELLURIUM COMPOUNDS