Published July 23, 2001
| Version v1
Journal article
Atomic-scale observation of polarization switching in epitaxial ferroelectric thin films
Description
The thin-film x-ray standing wave (XSW) technique is used for an atomic-scale study of polarization switching in ferroelectric Pb(Zr0.3Ti0.7)O3 (PZT)/electrode heterostructures grown on SrTiO3(001). The XSW is selectively generated in the PZT by the interference between the incident x-ray wave and the weak (001) Bragg diffracted wave from the film. The XSW excites a fluorescence signal from the Pb ions in the PZT film, that is used to determine their subangstroem displacements after polarization switching has occurred. This experimental method yields unique information on the underlying atomic configurations for different polarization domain states
Additional details
Identifiers
- DOI
- 10.1063/1.1385349;
Publishing Information
- Journal Title
- Applied Physics Letters
- Journal Volume
- 79
- Journal Issue
- 4
- Journal Page Range
- p. 515-517
- ISSN
- 0003-6951
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 32064762
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- FLUORESCENCE; POLARIZATION; STANDING WAVES; THIN FILMS
- Descriptors DEC
- EMISSION; FILMS; LUMINESCENCE; PHOTON EMISSION
Optional Information
- Contract/Grant/Project number
- F02-96ER45588; W-31-109-ENG-38
- Notes
- Othernumber: APPLAB000079000004000515000001; 051128APL
- Funding organization
- (US)