Published April 1, 2011
| Version v1
Journal article
Magnetic anisotropy of (Ge,Mn) nanostructures
Creators
- 1. Institut Nanosciences et Cryogenie, CEA-UJF, F-38054, Grenoble (France)
Description
We present a correlation between structural and magnetic properties of different (Ge,Mn) nanostructures grown on Ge(001) and Ge(111) substrates. Thin films of Ge1-xMnx were grown by low temperature molecular beam epitaxy to favor the out-of-equilibrium growth. Depending on the growth conditions crystalline or amorphous (Ge,Mn) nanocolumns have been observed on Ge(001) substrates. The magnetic properties were probed by superconducting quantum interference device (SQUID), vibrating sample magnetometer (VSM) and electron paramagnetic resonance (EPR). With the help of these complementary techniques (SQUID and EPR), magnetic anisotropy in these nanostructures has been investigated and different anisotropy constants were calculated.
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/292/1/012011Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 292
- Journal Issue
- 1
- Journal Page Range
- [5 p.]
- ISSN
- 1742-6596
Conference
- Title
- International conference on trends in spintronics and nanomagnetism
- Acronym
- TSN 2010
- Dates
- 23-27 May 2010
- Place
- Lecce (Italy)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43046976
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANISOTROPY; COMPUTERIZED SIMULATION; CORRELATIONS; CRYSTAL STRUCTURE; ELECTRON SPIN RESONANCE; EQUILIBRIUM; GERMANIUM; MAGNETIC PROPERTIES; MANGANESE; MOLECULAR BEAM EPITAXY; NANOSTRUCTURES; SQUID DEVICES; SUBSTRATES; THIN FILMS; VIBRATING SAMPLE MAGNETOMETERS
- Descriptors DEC
- CRYSTAL GROWTH METHODS; ELECTRONIC EQUIPMENT; ELEMENTS; EPITAXY; EQUIPMENT; FILMS; FLUXMETERS; MAGNETIC RESONANCE; MAGNETOMETERS; MEASURING INSTRUMENTS; METALS; MICROWAVE EQUIPMENT; PHYSICAL PROPERTIES; RESONANCE; SIMULATION; SUPERCONDUCTING DEVICES; TRANSITION ELEMENTS