Published 1999 | Version v1
Miscellaneous Open

Resistance to radiation of a 0.8 μm CMOS VLSI readout of instrumentation for accelerators used in tumor therapy

  • 1. Istituto Nazionale di Fisica Nucleare, INFN, Torino (Italy)
  • 2. ASP, Torino (Italy)
  • 3. Universite du Piemont occidental (Italy)

Description

This paper shows the results of irradiations with photons and neutrons of a Very Large Scale Integration (VLSI) CMOS AMS 0.8μm chip used in medical physics applications. It has been designed as readout of dosimeters and monitor chambers used on electron/photon and proton/carbon ions for tumor therapy. The chip is located close to the detectors and it is thus used in a radioactive environment. We have performed measurements on 30 MV X-rays, fast and thermal neutrons. The chip behaves well (i.e. the gain variations are below 1%) up to X- ray doses of 75 krad and a total fast neutron number of 4*1012. This allows the use of the chip over several years (>5) without performance modifications. It has to be noticed that in real life the dose rates are much lower than during the tests, allowing a self-repairing of the chip with annealing. No Single Event Effect was observed up to 1010 neutrons. (authors)

Availability note (English)

Available from INIS in electronic form

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Additional details

Additional titles

Original title (English)
Tenue aux radiations d'un VLSI CMOS 0.8 μm entrant dans l'instrumentation d'un accelerateur utilise pour la therapie des tumeurs

Publishing Information

Imprint Pagination
[3 p.]
Report number
INIS-FR--1999

Conference

Title
5. European conference on radiation and its effects on components and systems
Original Conference Title
5. congres europeen les radiations et leurs effets sur les composants et les systemes
Dates
13-17 Sep 1999
Place
Abbaye de Fontevraud (France)

INIS

Country of Publication
France
Country of Input or Organization
France
INIS RN
34077993
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
DAMAGING NEUTRON FLUENCE; DOSEMETERS; MOS TRANSISTORS; PERFORMANCE TESTING; PHYSICAL RADIATION EFFECTS
Descriptors DEC
MEASURING INSTRUMENTS; NEUTRON FLUENCE; RADIATION EFFECTS; SEMICONDUCTOR DEVICES; TESTING; TRANSISTORS

Optional Information

Notes
5 refs.