Resistance to radiation of a 0.8 μm CMOS VLSI readout of instrumentation for accelerators used in tumor therapy
Creators
- 1. Istituto Nazionale di Fisica Nucleare, INFN, Torino (Italy)
- 2. ASP, Torino (Italy)
- 3. Universite du Piemont occidental (Italy)
Description
This paper shows the results of irradiations with photons and neutrons of a Very Large Scale Integration (VLSI) CMOS AMS 0.8μm chip used in medical physics applications. It has been designed as readout of dosimeters and monitor chambers used on electron/photon and proton/carbon ions for tumor therapy. The chip is located close to the detectors and it is thus used in a radioactive environment. We have performed measurements on 30 MV X-rays, fast and thermal neutrons. The chip behaves well (i.e. the gain variations are below 1%) up to X- ray doses of 75 krad and a total fast neutron number of 4*1012. This allows the use of the chip over several years (>5) without performance modifications. It has to be noticed that in real life the dose rates are much lower than during the tests, allowing a self-repairing of the chip with annealing. No Single Event Effect was observed up to 1010 neutrons. (authors)
Availability note (English)
Available from INIS in electronic formFiles
34077993.pdf
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Additional details
Additional titles
- Original title (English)
- Tenue aux radiations d'un VLSI CMOS 0.8 μm entrant dans l'instrumentation d'un accelerateur utilise pour la therapie des tumeurs
Publishing Information
- Imprint Pagination
- [3 p.]
- Report number
- INIS-FR--1999
Conference
- Title
- 5. European conference on radiation and its effects on components and systems
- Original Conference Title
- 5. congres europeen les radiations et leurs effets sur les composants et les systemes
- Dates
- 13-17 Sep 1999
- Place
- Abbaye de Fontevraud (France)
INIS
- Country of Publication
- France
- Country of Input or Organization
- France
- INIS RN
- 34077993
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- DAMAGING NEUTRON FLUENCE; DOSEMETERS; MOS TRANSISTORS; PERFORMANCE TESTING; PHYSICAL RADIATION EFFECTS
- Descriptors DEC
- MEASURING INSTRUMENTS; NEUTRON FLUENCE; RADIATION EFFECTS; SEMICONDUCTOR DEVICES; TESTING; TRANSISTORS
Optional Information
- Notes
- 5 refs.