Published May 2006
| Version v1
Journal article
Magnetic and critical properties of models of magnetic superlattices
- 1. Institute of Physics Daghestan Scientific Center of RAS, ul. M. Jaragskogo, 94, Makhachkala 367003 (Russian Federation)
- 2. ICAPE, St. Petersburg State University, 14 linia V.O., 29, 199178, St. Petersburg (Russian Federation)
Description
For theoretical simulation of critical behavior in multilayers, we have suggested a model of superlattice Fe/V. The calculations were performed using the Monte Carlo method. The relation between interlayer and intralayer exchange coupling was varied in a wide limit that allowed description of the systems with different concentration of adsorbed hydrogen. We have calculated spontaneous magnetization, susceptibility and specific heat as functions of the temperature and exchange parameters. The critical temperature and static critical exponents have been calculated and phase diagrams have been plotted
Additional details
Identifiers
- DOI
- 10.1016/j.jmmm.2005.10.212;
- PII
- S0304-8853(05)01038-3;
Publishing Information
- Journal Title
- Journal of Magnetism and Magnetic Materials
- Journal Volume
- 300
- Journal Issue
- 1
- Journal Page Range
- p. e546-e549
- ISSN
- 0304-8853
- CODEN
- JMMMDC
Conference
- Title
- 3. Moscow international symposium on magnetism 2005
- Dates
- 26-30 Jun 2005
- Place
- Moscow (Russian Federation)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37104046
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- COUPLING; CRITICAL TEMPERATURE; HYDROGEN; MAGNETIZATION; MONTE CARLO METHOD; PHASE DIAGRAMS; PHASE TRANSFORMATIONS; SIMULATION; SPECIFIC HEAT; SUPERLATTICES
- Descriptors DEC
- CALCULATION METHODS; DIAGRAMS; ELEMENTS; INFORMATION; NONMETALS; PHYSICAL PROPERTIES; THERMODYNAMIC PROPERTIES; TRANSITION TEMPERATURE
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.