Published January 2002
| Version v1
Journal article
Topographic contrast of near-surface defects in Borrmann-Lehmann geometry
- 1. Inst. Problem Tekhnologii Mikroehlektroniki RAN, Chernogolovka, Moskovskaya Oblast' (Russian Federation)
- 2. Inst. Fiziki Tverdogo Tela RAN, Chernogolovka, Moskovskaya Oblast' (Russian Federation)
Description
The studies carried out are connected with the X-ray diffraction optics, which is related to the investigation of diffraction image of defects in a crystal lattice by X-ray topography methods. The formation of the image of near-surface defects in Borrmann-Lehmann geometry has been investigated experimentally and by computer simulation. Specific features of the formation of the contrast of defects depending on their position relative to a triangle of the energy flux have been found. A high sensitivity of the interference pattern to distortions on a lateral surface of a specimen has been demonstrated
Abstract (Russian)
Проведенные исследования относятся к разделу рентгеновской дифракционной оптики, который связан с изучением дифракционного изображения дефектов кристаллической решетки в методах рентгеновской топографии. Экспериментально и методом компьютерного моделирования изучено формирование изображения приповерхностных дефектов в геометрии Бормана-Леемана. Установлены закономерности формирования контраста дефектов в заивисимости от их положения относительно треугольника потока энергии. Продемонстрирована высокая чувствительность интерференционной картины к искажениям на боковой поверхности образцаAdditional details
Additional titles
- Original title (Russian)
- Топографический контраст приповерхностных дефектов в геометрии Бормана-Леемана
Publishing Information
- Journal Title
- Poverkhnost'. Rentgenovskie, Sinkhrotronnye i Nejtronnye Issledovaniya
- Journal Issue
- no.1
- Journal Page Range
- p. 100-105
- ISSN
- 1028-0960
Conference
- Title
- Working conference X-ray optics-2001
- Original Conference Title
- Rabochee soveshchanie Rentgenovskaya optika-2001
- Dates
- 19-22 Feb 2001
- Place
- Nizhnij Novgorod (Russian Federation)
INIS
- Country of Publication
- Russian Federation
- Country of Input or Organization
- Russian Federation
- INIS RN
- 34010465
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- COMPUTERIZED SIMULATION; CRYSTAL DEFECTS; CRYSTAL LATTICES; IMAGES; INTERFEROMETRY; SENSITIVITY; SILICON; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; CRYSTAL STRUCTURE; DIFFRACTION; ELEMENTS; SCATTERING; SEMIMETALS; SIMULATION
Optional Information
- Notes
- 17 refs., 4 figs.