Published October 7, 2003 | Version v1
Journal article

Investigation of Copper(I) Oxide Quantum Dots by Near-Edge X-ray Absorption Fine Structure Spectroscopy

Description

Copper oxide quantum dots (CuOQD) were grown in various thicknesses on different SrTiO3(001) surfaces and were investigated by near edge x-ray absorption fine structure (NEXAFS) spectroscopy. The experimental growth conditions for the CuOQD were optimized to obtain Cu2O as the major phase. The CuOQD grown on clean SrTiO3(001) surfaces at 825 K or higher with p(O2) of 9.0x10-7 Torr or above contain mostly CuO contrasting to CuOQD grown at 800 K with p(O2) of ∼ 7.0x10-7 Torr that contain primarily Cu2O. Furthermore, it is established that there is a strong interaction between the SrTiO3(001) surface and the first few monolayers of the CuOQD, which induces the formation of Cu(II). However, this interaction is mitigated with increasing thickness of CuOQD resulting in the exclusive formation of Cu2O in the topmost layers. The influence of the SrTiO3(001) substrate on the formation of CuOQD can be reduced by modifying the substrate surface using chemical treatment and/or energetic Au2+ ion-beam irradiation, since the substrate effect results from the reaction between the substrate oxygen and the copper atoms from the CuOQD. Examination of the photochemical properties of these CuOQD shows that prolonged soft x-ray irradiation under vacuum reduces Cu(II), which is present as a minor impurity in the CuOQD

Additional details

Publishing Information

Journal Title
Chemistry of Materials
Journal Volume
20
Journal Issue
15
Journal Page Range
p. 3939-3946
ISSN
0897-4756

Optional Information

Contract/Grant/Project number
AC06-76RL01830
Funding organization
US Department of Energy (United States)
Secondary number(s)
PNNL-SA--37777