Published April 2021 | Version v1
Journal article

Bandgap engineering in SrTiO3 thin films by electronic excitations: A synchrotron-based spectroscopic study

  • 1. Department of Physics and Astrophysics, University of Delhi, Delhi 110007 (India)
  • 2. Inter-University Accelerator Centre, Aruna Asaf Ali Marg, New Delhi 110067 (India)
  • 3. National Synchrotron Radiation Research Center, Hsinchu 30076 (China)
  • 4. Department of Physics, Tamkang University, Tamsui 25137 (China)

Description

Engineering the optical bandgap of metal oxides is essential for optoelectronic and photocatalytic applications. The present study reports the application of electronic excitations, induced by 125 MeV Ag ions, in tuning the bandgap of SrTiO3 films in the range of 2.93-3.78 eV and their correlation with the synchrotron-based X-ray diffraction pattern and X-ray absorption spectra (XAS). The pre-edge spectral features in the XAS at Ti K-edge show significant variation in the valence state implying the role of electronic excitations in modifying the local electronic structures mainly the distortion in the TiO6 octahedra and the ratio of area under t2g/eg. This study gives an insight about the role of structural properties and electronic structures in bandgap tuning.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.scriptamat.2021.113725

Additional details

Identifiers

DOI
10.1016/j.scriptamat.2021.113725;
PII
S1359646221000051;

Publishing Information

Journal Title
Scripta Materialia
Journal Volume
195
Journal Page Range
vp.
ISSN
1359-6462
CODEN
SCMAF7

Optional Information

Copyright
Copyright (c) 2021 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.