The diffusion of metal in polymer films

Both the Rutherford backscattering spectrometry (RBS) and the secondary ion mass spectrometry (SIMS) techniques have been employed in studying the diffusion of metal atoms in a polymer film. Au,Ag and Cu films of uniform 90-110 A thickness were evaporated on polymethyl methacrylates (PMMA) and lucite. Radiation damage on lucite was limited by scanning a 1.25 MeV He ion beam in a large circular pattern on a lucite disk. The Au diffusion tail was clearly visible in the RBS spectrum. The solubility of Au in lucite has been estimated at 900C annealing for 48 h. The SIMS profile of 100 A Au film on the high molecular weight PMMA is consistent with the RBS result for lucite. (author)