Published April 1996
| Version v1
Journal article
Synthesis and estimation of Nb-N multilayers (N = Al, Au)
Creators
- 1. Takushoku University, 815-1 Tatemachi, Hachioji-shi 193 (Japan)
- 2. Nishi Tokyo University, 2525 Uenohara-machi 409-01 (Japan)
Description
Multilayers made of superconducting thin film (S) and normal metal thin film (N) can be applied to various superconducting devices such as a multilayered Josephson junction. In this paper, S-N metallic multilayers were synthesized by using off-axial DC magnetron sputtering apparatus. Structures of S-N multilayer samples such as Nb - Al-Si were analysed by use of the Auger electron spectroscopy. X-ray photoelectron spectroscopy and x-ray diffraction analyses of the interface were also carried out. (author)
Availability note (English)
Available online at the Web site for the journal Superconductor Science and Technology (ISSN 1361-6668) http://www.iop.org/Additional details
Identifiers
- URL
- http://www.iop.org/;
Publishing Information
- Journal Title
- Superconductor Science and Technology
- Journal Volume
- 9
- Journal Issue
- 4A
- Journal Page Range
- p. A144-A147
- ISSN
- 0953-2048
Conference
- Title
- ISEC '95 (International Superconductive Electronics Conference)
- Dates
- 18-21 Sep 1995
- Place
- Nagoya (Japan)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 32005354
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ALUMINIUM; GOLD; JOSEPHSON JUNCTIONS; NIOBIUM; PHOTOELECTRON SPECTROSCOPY; SUPERCONDUCTING FILMS; SUPERCONDUCTING JUNCTIONS; THIN FILMS
- Descriptors DEC
- ALLOYS; ELECTRON SPECTROSCOPY; ELEMENTS; FILMS; METALS; REFRACTORY METALS; SEMICONDUCTOR JUNCTIONS; SPECTROSCOPY; SUPERCONDUCTING JUNCTIONS; TRANSITION ELEMENTS