Published December 27, 1985
| Version v1
Patent
Goniometer device for X-ray or neutron diffraction on monocrystals
Description
The goniometer device is characterized by the sample carrier which is carried by a slave goniometer. This goniometer includes a transverse ferromagnetic rod related to the sample carrier, a support on which is fixed the sample carrier part of a cardan. Means exist to create a magnetic field whose orientation is variable in the space so that for each given orientation of the magnetic field the ferromagnet rod and consequently the sample carrier and the monocrystal take this orientation
Availability note (English)
Available from Institut National de la Propriete Industrielle, Paris (France).Abstract (French)
La presente invention concerne un dispositif goniometrique pour diffractometrie de rayons X ou de neutrons sur des monocristaux. Ce dispositif goniometrique est caracterise en ce que le porte-echantillon est porte par un goniometre esclave comprenant un barreau en matiere ferromagnetique transversale solidaire du porte-echantillon, un support sur lequel est monte a rotation le porte-echantillon et qui fait partie d'un cardan monte sur une embase fixe et des moyens sont prevus pour creer un champ magnetique H d'orientation variable dans l'espace de maniere que pour chaque orientation determinee du champ magnetique le barreau ferromagnetique et par consequent le porte-echantillon et le monocristal prennent cette meme orientationAdditional details
Additional titles
- Original title (French)
- Dispositif goniometrique pour diffractometrie de rayons X ou de neutrons sur des monocristaux
Publishing Information
- Imprint Pagination
- 15 p.
- IPC:
- Int. Cl. G01n23/207.
- IPC
- Int. Cl. G01n23/207.
- Patent number
- FR patent document 2566533/A/
INIS
- Country of Publication
- France
- Country of Input or Organization
- France
- INIS RN
- 18077107
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Non-conventional Literature
- Descriptors DEI
- GONIOMETERS; MONOCRYSTALS; NEUTRON DIFFRACTION; NEUTRON DIFFRACTOMETERS; X-RAY DIFFRACTION; X-RAY DIFFRACTOMETERS
- Descriptors DEC
- COHERENT SCATTERING; CRYSTALS; DIFFRACTION; DIFFRACTOMETERS; MEASURING INSTRUMENTS; SCATTERING
Optional Information
- Secondary number(s)
- FR patent application 84 09846.