Published 1995
| Version v1
Book
Studies of calcium-nickel-potassium oxide films by synchrotron x-ray fluorescence microscopy
- 1. Lawrence Berkeley Lab., CA (United States)
Description
The use of synchrotron x-ray fluorescence microscopy to study the composition and homogeneity of layer deposited films of calcium-nickel-potassium oxides is described. Experimental conditions for preparing the films are given, and the results are discussed with respect to the x-ray fluorescence data concerning the distribution of the three metals in the films
Additional details
Publishing Information
- Publisher
- Materials Research Society.
- Imprint Place
- Pittsburgh, PA (United States)
- ISBN
- 1-55899-277-4
- Imprint Title
- Applications of synchrotron radiation techniques to materials science II
- Imprint Pagination
- 349 p.
- Series
- Materials Research Society symposium proceedings, Volume 375.
- Journal Page Range
- p. 307-311.
Conference
- Title
- 1994 fall meeting of the Materials Research Society (MRS).
- Dates
- 28 Nov - 2 Dec 1994.
- Place
- Boston, MA (United States).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 27004193
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference, Numerical Data
- Descriptors DEI
- CALCIUM OXIDES; CATALYSTS; CHEMICAL COMPOSITION; EXPERIMENTAL DATA; MICROANALYSIS; NICKEL OXIDES; POTASSIUM OXIDES; SAMPLE PREPARATION; X-RAY FLUORESCENCE ANALYSIS
- Descriptors DEC
- ALKALI METAL COMPOUNDS; ALKALINE EARTH METAL COMPOUNDS; CALCIUM COMPOUNDS; CHALCOGENIDES; CHEMICAL ANALYSIS; DATA; INFORMATION; NICKEL COMPOUNDS; NONDESTRUCTIVE ANALYSIS; NUMERICAL DATA; OXIDES; OXYGEN COMPOUNDS; POTASSIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS; X-RAY EMISSION ANALYSIS
Optional Information
- Secondary number(s)
- CONF-941144--.