Metal microdetectors for real-time imaging of fractionated charged particles and gamma-rays beams

Published 2019 | Version v1

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1. Institute for Nuclear Research, National Academy of Sciences of Ukraine, Kyiv (Ukraine)

no abstract available

Additional details

Original title (Ukrainian): Metalevyi myikrodetektori dlya yikh zobrazhennya v real'nomu chasyi prostorovo fraktsyionovanikh puchkyiv zaryadzhenikh chastinok ta gama-kvantyiv

Publisher: INR NAS of Ukraine
Imprint Place: Kyiv (Ukraine)
Imprint Title: Book of abstract of 26th annual scientific conference of Institute for Nuclear Research of National Academy of Sciences of Ukraine
Imprint Pagination: 204 p.
Journal Page Range: p. 55
Report number: INIS-UA--202

Title: 26. annual scientific conference of Institute for Nuclear Research of National Academy of Sciences of Ukraine
Original Conference Title: Tezi dopovyidej 26 shchoryichnoyi naukovoyi konferentsyiyi Yinstitutu Yadernikh Doslyidzhen' Natsyional'noyi Akademyiyi Nauk Ukrayini
Dates: 8-12 Apr 2019
Place: Kyiv (Ukraine)

Country of Publication: Ukraine
Country of Input or Organization: Ukraine
INIS RN: 50056521
Subject category: S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator: Conference, No Abstract, Non-conventional Literature
Descriptors DEI: CHARGED PARTICLE DETECTION; FRACTIONATED IRRADIATION; GAMMA RADIATION; ON-LINE MEASUREMENT SYSTEMS; POSITION SENSITIVE DETECTORS; REAL TIME SYSTEMS; SI MICROSTRIP DETECTORS; SPATIAL DISTRIBUTION; SYNCHROTRON RADIATION
Descriptors DEC: BREMSSTRAHLUNG; DETECTION; DISTRIBUTION; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; IRRADIATION; MEASURING INSTRUMENTS; ON-LINE SYSTEMS; RADIATION DETECTION; RADIATION DETECTORS; RADIATIONS; SEMICONDUCTOR DETECTORS; SI SEMICONDUCTOR DETECTORS

Notes: Imprint:26. shchoryichna naukova konferentsyiya Yinstitutu Yadernikh Doslyidzhen' Natsyional'noyi Akademyiyi Nauk Ukrayini