Published September 1, 2012 | Version v1
Miscellaneous

RF Surface Impedance Characterization of Potential New Materials for SRF-based Accelerators

  • 1. College of William and Mary, Williamsburg, VA (United States)
  • 2. Thomas Jefferson National Accelerator Facility, Newport News, VA (United States)

Description

In the development of new superconducting materials for possible use in SRF-based accelerators, it is useful to work with small candidate samples rather than complete resonant cavities. The recently commissioned Jefferson Lab RF Surface Impedance Characterization (SIC) system can presently characterize the central region of 50 mm diameter disk samples of various materials from 2 to 40 K exposed to RF magnetic fields up to 14 mT at 7.4 GHz. We report the recent measurement results of bulk Nb, thin film Nb on Cu and sapphire substrates, Nb3Sn sample, and thin film MgB2 on sapphire substrate provided by colleagues at JLab and Temple University

Availability note (English)

Available from https://misportal.jlab.org/ul/publications/downloadFile.cfm?pub_id=11474; PURL: http://www.osti.gov/servlets/purl/1088995/

Additional details

Publishing Information

Imprint Pagination
3 p.
Report number
JLAB-ACC--12-1640

Conference

Title
26. Linear Accelerator Conference
Acronym
LINAC 12
Dates
9-14 Sep 2012
Place
Tel Aviv (Israel)

Optional Information

Contract/Grant/Project number
AC05-06OR23177
Funding organization
USDOE Office of Science - SC (United States)
Secondary number(s)
OSTIID--1088995; DOE/OR/23177--2336