Uncertainty on subsurface defect evaluation using experiment and simulation in infrared thermography

In this study, the factors leading to uncertainty in defect size detection and measurement in lock-in thermography and simulation were investigated. The lock-in thermography technique was applied to measure the size of subsurface defects in SM45C specimens. In addition, the development of a finite element analysis model using ANSYS 15.0 software and an uncertainty study were carried out. As a result, the uncertainty of the defect size measurement, according to the excitation frequency, was analyzed. The uncertainty evaluation results of the lock-in thermography and the finite element model are presented herein