Lifetime and radiative efficiency vs density in the strain-confined electron-hole liquid in Ge

Experiments on the electron-hole liquid (EHL) in inhomogeneously stressed Ge were performed in order to obtain information on the lifetime and radiative efficiency as a function of e-h pair density in the strain-confined electron-hole liquid (SCEHL). The data can only be explained if a density-independent recombination mechanism is the most important decay process. The result is shown to be consistent with other experiments indicating that such a mechanism has a negligible effect on the recombination time in unstressed Ge