Published December 5, 2005
| Version v1
Journal article
Short-channel polymer field-effect-transistor fabrication using spin-coating-induced edge template and ink-jet printing
Creators
- 1. Technology Platform Research Centre, Seiko- Epson Corporation, 281 Fujimi, Nagano 399-0293 (Japan)
- 2. Cambridge Research Laboratory of Epson, 9a Science Park, Milton Road, Cambridge CB4 0FE (United Kingdom)
- 3. Engineering Department, University of Cambridge, Trumpington St., Cambridge CB2 1PZ, United Kingdom, and Cambridge Research Laboratory of Epson, 9a Science Park, Milton Road, Cambridge CB4 0FE (United Kingdom)
Description
A method to fabricate polymer field-effect transistors with submicron channel lengths is described. A thin polymer film is spin coated on a prepatterned resist with a low resolution to create a thickness contrast in the overcoated polymer layer. After plasma and solvent etching, a submicron-sized line structure, which templates the contour of the prepattern, is obtained. A further lift-off process is applied to define source-drain electrodes of transistors. With a combination of ink-jet printing, transistors with channel length down to 400 nm have been fabricated by this method. We show that drive current density increases as expected, while the on/off current ratio 106 is achieved
Additional details
Identifiers
- DOI
- 10.1063/1.2140586;
Publishing Information
- Journal Title
- Applied Physics Letters
- Journal Volume
- 87
- Journal Issue
- 23
- Journal Page Range
- p. 232111-232111.3
- ISSN
- 0003-6951
- CODEN
- APPLAB
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37021672
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CURRENT DENSITY; ELECTRODES; FABRICATION; FIELD EFFECT TRANSISTORS; ORGANIC SEMICONDUCTORS; POLYMERS; THIN FILMS
- Descriptors DEC
- FILMS; MATERIALS; SEMICONDUCTOR DEVICES; SEMICONDUCTOR MATERIALS; TRANSISTORS
Optional Information
- Notes
- (c) 2005 American Institute of Physics