Published February 9, 2012
| Version v1
Journal article
Direct measurements of three-dimensional localization of light near the nanostructures with sub-wavelength spatial resolution
Creators
- 1. All-Russian research institute of optico-physical measurements, 46 Ozernaya St., Moscow, 119361 (Russian Federation)
- 2. Faculty of Physics, Lomonosov Moscow State University, 1-2 Leninskiye Gory, Moscow, GSP-1, 119991 (Russian Federation)
Description
Here we report on the development of a scanning near field microscope to map the sub-wavelength localization of light. The equipment can detect the intensity and polarization of an alternating electromagnetic field of optical frequency, which is localized in the close proximity to nanoobjects and nanostructures.
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/345/1/012005Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 345
- Journal Issue
- 1
- Journal Page Range
- [3 p.]
- ISSN
- 1742-6596
Conference
- Title
- 4. nanotechnology international forum
- Acronym
- RUSNANOTECH 2011
- Dates
- 26-28 Oct 2011
- Place
- Moscow (Russian Federation)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43105177
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ELECTROMAGNETIC FIELDS; MICROSCOPES; NANOSTRUCTURES; POLARIZATION; SPATIAL RESOLUTION; VISIBLE RADIATION; WAVELENGTHS
- Descriptors DEC
- ELECTROMAGNETIC RADIATION; RADIATIONS; RESOLUTION