Published December 5, 2006 | Version v1
Journal article

Role of Ti out-diffusion from a Pt/Ti bi-layer on the crystalline growth of (Ba,Sr)TiO3: A transmission electron microscopy investigation

  • 1. LMP-STMicroelectronics, 16 rue Pierre et Marie Curie, BP7155, 37071 Tours Cedex 2 (France) and Laboratoire LEMA, Faculte des Sciences et Techniques, Universite Francois Rabelais, FRE2077 CNRS, LRC CEA M01 Parc de Grandmont, Tours 37200 (France)
  • 2. Laboratoire LEMA, Faculte des Sciences et Techniques, Universite Francois Rabelais, FRE2077 CNRS, LRC CEA M01 Parc de Grandmont, Tours 37200 (France)
  • 3. Laboratoire SPCTS, UMR6638 CNRS, Limoges (France)
  • 4. CEA Le Ripault, BP16, 37260 Monts (France)

Description

We investigated the influence of the Ti out-diffusion in Pt/TiO x/SiO2/Si substrates (0 ≤ x ≤ 2), having different thicknesses of Pt and TiO x layers, on the crystalline growth of (Ba,Sr)TiO3 (BST) deposited by pulsed laser deposition. By means of X-ray diffraction and transmission electron microscopy, we show that the orientation of BST clearly depends on the presence and quantity of Ti having migrated up to the Pt surface, and on its possible oxidation prior to BST deposition, which was controlled by the atmosphere (vacuum or oxygen) of the pre-heating stage of the BST deposition process. Whereas BST has no preferential orientation if grown on a bare Pt surface, a strong (111) orientation of BST is obtained for a limited diffusion of titanium oxides on the Pt surface just before BST deposition. However, the (111) orientation is lost if this seeding titanium oxide layer on Pt is too thick just before BST deposition. Also, the formation of protrusions was evidenced at the BST/Pt interface and associated with the oxidation of Ti within the Pt layer

Additional details

Identifiers

DOI
10.1016/j.tsf.2006.03.012;
PII
S0040-6090(06)00441-X;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
515
Journal Issue
4
Journal Page Range
p. 1260-1265
ISSN
0040-6090
CODEN
THSFAP

Optional Information

Copyright
Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.