Published August 2001 | Version v1
Journal article Metadata-only

Quantitative analysis of disperse mixed systems by the XPS method

Creators

  • 1. Institut metallofiziki, Kyiv (Ukraine)

Description

A mathematical formalism for simulation of mixed systems with a low specific surface area is described. A method for quantitative analysis of XPS intensities for a mixed system consisting of two types of spherical particles is proposed

Additional details

Additional titles

Original title (Russian)
Количественный анализ дисперсных смешанных систем методом RFS

Publishing Information

Journal Title
Dopovyidyi Natsyional'noyi Akademyiyi Nauk Ukrayini
Journal Issue
no.8
Journal Page Range
p. 78-81
ISSN
1025-6415

INIS

Country of Publication
Ukraine
Country of Input or Organization
Ukraine
INIS RN
33014133
Subject category
S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
Descriptors DEI
DISPERSIONS; MATHEMATICAL MODELS; PARTICLES; PHOTOELECTRON SPECTROSCOPY; SIMULATION; SPECIFIC SURFACE AREA; X-RAY SPECTROSCOPY
Descriptors DEC
ELECTRON SPECTROSCOPY; PHYSICAL PROPERTIES; SPECTROSCOPY