Published August 2013 | Version v1
Journal article

Novel correction methods on a miniature tensile device based on a modular non-standard layout

  • 1. College of Mechanical Science and Engineering, Jilin University, Renmin Street 5988, Changchun, 130025 (China)

Description

A novel in situ tensile device with a large output load–volume ratio was developed for testing the mechanical properties of bulk materials. A major characteristic of the device was the modular non-standard layout, as the specimen was placed on the top plane of the device to approach the lens of an optical microscope or the electron gun of a scanning electron microscope. Accordingly, to investigate the effects of non-standard layout on tensile properties, displacement and load correction methods were given by formulas based on theoretical calculations to describe the specimen's actual tensile displacement and load. Based on in situ observation, the feasibility of the correction method was verified by comparing it with the data from metallographic microscope images. The bending effects on the specimen's vertical displacements and tensile load due to the installation mode were also discussed. This paper presents a modularized correction method for a horizontal-type tensile device with a non-standard layout design. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/0957-0233/24/8/085901

Additional details

Publishing Information

Journal Title
Measurement Science and Technology
Journal Volume
24
Journal Issue
8
Journal Page Range
[8 p.]
ISSN
0957-0233
CODEN
MSTCEP

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
46018374
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
COMPARATIVE EVALUATIONS; CORRECTIONS; DESIGN; ELECTRON GUNS; IMAGES; LENSES; MATERIALS TESTING; METALLOGRAPHY; OPTICAL MICROSCOPES; SCANNING ELECTRON MICROSCOPY; TENSILE PROPERTIES
Descriptors DEC
ELECTRON MICROSCOPY; EVALUATION; MECHANICAL PROPERTIES; MICROSCOPES; MICROSCOPY; TESTING