Published October 2011 | Version v1
Journal article

Advantages of SixSb2Te phase-change material and its applications in phase-change random access memory

  • 1. Graduate School of the Chinese Academy of Sciences, Beijing 100049 (China)
  • 2. State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai 200050 (China)

Description

Si-doped Sb2Te phase-change material was investigated for the application of phase-change memory. During the electrical test, Si0.53Sb2Te needs a lower phase-change operating voltage than Ge2Sb2Te5. For the storage of data for 10 years, Si0.53Sb2Te needs an annealing temperature that is about 24 oC higher than for Ge2Sb2Te5. Crystallization changes from being growth dominated to being nucleation dominated. X-ray diffraction patterns indicate that the polycrystalline SixSb2Te series has a δ-phase with a rhombohedral crystalline structure, similar to the pure Sb2Te.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.scriptamat.2011.06.045

Additional details

Identifiers

DOI
10.1016/j.scriptamat.2011.06.045;
PII
S1359-6462(11)00384-8;

Publishing Information

Journal Title
Scripta Materialia
Journal Volume
65
Journal Issue
7
Journal Page Range
p. 622-625
ISSN
1359-6462
CODEN
SCMAF7

Optional Information

Copyright
Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.