Published October 2011
| Version v1
Journal article
Advantages of SixSb2Te phase-change material and its applications in phase-change random access memory
Creators
- 1. Graduate School of the Chinese Academy of Sciences, Beijing 100049 (China)
- 2. State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai 200050 (China)
Description
Si-doped Sb2Te phase-change material was investigated for the application of phase-change memory. During the electrical test, Si0.53Sb2Te needs a lower phase-change operating voltage than Ge2Sb2Te5. For the storage of data for 10 years, Si0.53Sb2Te needs an annealing temperature that is about 24 oC higher than for Ge2Sb2Te5. Crystallization changes from being growth dominated to being nucleation dominated. X-ray diffraction patterns indicate that the polycrystalline SixSb2Te series has a δ-phase with a rhombohedral crystalline structure, similar to the pure Sb2Te.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.scriptamat.2011.06.045Additional details
Identifiers
- DOI
- 10.1016/j.scriptamat.2011.06.045;
- PII
- S1359-6462(11)00384-8;
Publishing Information
- Journal Title
- Scripta Materialia
- Journal Volume
- 65
- Journal Issue
- 7
- Journal Page Range
- p. 622-625
- ISSN
- 1359-6462
- CODEN
- SCMAF7
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45024627
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ANNEALING; ANTIMONY TELLURIDES; CRYSTAL GROWTH; CRYSTALLIZATION; DOPED MATERIALS; ELECTRIC POTENTIAL; GERMANIUM COMPOUNDS; NUCLEATION; PHASE CHANGE MATERIALS; POLYCRYSTALS; RANDOMNESS; SILICON COMPOUNDS; TRIGONAL LATTICES; X-RAY DIFFRACTION
- Descriptors DEC
- ANTIMONY COMPOUNDS; CHALCOGENIDES; COHERENT SCATTERING; CRYSTAL LATTICES; CRYSTAL STRUCTURE; CRYSTALS; DIFFRACTION; HEAT TREATMENTS; MATERIALS; PHASE TRANSFORMATIONS; SCATTERING; TELLURIDES; TELLURIUM COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.