Published 1998 | Version v1
Miscellaneous

TEM studies of the crystal growth of indanthrone pigments

Description

The aim of this work was to study the crystal growth of indanthrone during the pigmentation process. The colouring properties of a pigment are dependant on the chemical and crystallographic structure of the pigment. However, other factors are known to affect these properties including particle size, particle size distribution and level of dispersion in the chosen application medium. The parameters which affect the growth of the pigment particles were investigated with the emphasis placed on the mechanism by which growth took place. The final form of the crystals after growth was also investigated in some detail. Various electron microscopy techniques were employed in the investigations in this thesis. High and low magnification imaging and diffraction were studied on the CTEM (conventional transmission electron microscope) whilst PEELS (parallel electron energy loss spectroscopy) and DPC (differential phase contrast) studies took place on the VG HB5 STEM (scanning transmission electron microscope). In addition to these studies, x-ray diffraction and surface area analysis techniques were employed. The low magnification CTEM work gave good information on the size, shape and size distribution of the pigment particles and enabled detailed analysis of the level of growth attained under varied reaction conditions. (author)

Availability note (English)

Available from British Library Document Supply Centre- DSC:DXN043898

Additional details

Publishing Information

Imprint Pagination
[vp.]

INIS

Country of Publication
United Kingdom
Country of Input or Organization
United Kingdom
INIS RN
32066499
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Thesis, Non-conventional Literature
Descriptors DEI
CRYSTAL GROWTH; ELECTRON SPECTROSCOPY; MICROSTRUCTURE; MONOCRYSTALS; PIGMENTS; STRUCTURAL CHEMICAL ANALYSIS; SURFACE AREA; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION
Descriptors DEC
COHERENT SCATTERING; CRYSTALS; DIFFRACTION; ELECTRON MICROSCOPY; MICROSCOPY; SCATTERING; SPECTROSCOPY; SURFACE PROPERTIES