Published March 2006 | Version v1
Journal article

Characterization of BexCd1-xSe alloys by contactless electroreflectance

  • 1. Department of Electronic Engineering, National Taiwan University of Science and Technology, Taipei 106 (Taiwan)
  • 2. Department of Chemistry, City College of the City University of New York, New York, New York 10031 (United States)
  • 3. Institute of Physics, N. Copernicus University, Grudziadzka 5/7, 87-100 Torun (Poland)

Description

We present characterization of a Bridgman-grown wurtzite-type Be0.075Cd0.925Se mixed crystal and a zinc-blende Be0.09Cd0.91Se epilayer grown by MBE on InP substrate using contactless electroreflectance in the temperature range of 15 to 400 K. Various interband transitions, originating from the band edge and spin-orbit splitting critical points, of the samples have been observed. The parameters that describe the temperature dependence of the fundamental and spin split-off band gaps are evaluated. (copyright 2006 WILEY-VCH Verlag GmbH and Co. KGaA, Weinheim) (orig.)

Availability note (English)

Available from: http://dx.doi.org/10.1002/pssc.200564661

Additional details

Identifiers

Publishing Information

Journal Title
Physica Status Solidi. C, Conferences
Journal Volume
3
Journal Issue
4
Journal Page Range
p. 738-741
ISSN
1610-1634

Conference

Title
12. international conference on II-VI compounds
Dates
12-16 Sep 2005
Place
Warsaw (Poland)

Optional Information

Notes
With 3 figs., 1 tab., 13 refs.. SICI: 1610-1634(200603)3:4<738::AID-PSSC200564661>3.0.TX;2-Z