Published November 1, 1990
| Version v1
Journal article
Ewald's extended dynamical theory of diffraction on a crystal of finite thickness
Creators
- 1. Universita J.E. Purkyne, Brno (Czechoslovakia). Dept. of Theoretical Physics and Astrophysics
- 2. Budapesti Mueszaki Egyetem, Budapest (Hungary). Dept. of Mathematics
Description
Exact formulae of Ewald's conception of the extended dynamical theory of diffraction are applied to a crystal of finite thickness. The results obtained are compared with those yielded by conventional and extended Laue theory. (orig.)
Additional details
Publishing Information
- Journal Title
- Acta Crystallographica. Section A: Foundations of Crystallography
- Journal Volume
- 46
- Journal Issue
- 11
- Series
- Acta Crystallogr., Sect. A: Found. Crystallogr.
- Journal Page Range
- 897-900
- ISSN
- 0108-7673
- CODEN
- ACACE
INIS
- Country of Publication
- Denmark
- Country of Input or Organization
- Denmark
- INIS RN
- 22024116
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ABSORPTION; CRYSTALS; DYNAMICS; LAUE METHOD; MATHEMATICAL MODELS; THICKNESS; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; DIFFRACTION METHODS; DIMENSIONS; MECHANICS; SCATTERING