Published January 2007
| Version v1
Journal article
Apparatus for time-resolved and energy-resolved measurement of internal conversion electron emission induced by nuclear resonant excitation with synchrotron radiation
Creators
- 1. Japan Synchrotron Radiation Research Institute, Hyogo (Japan)
- 2. Institute of Materials Structure Science, High Energy Accelerator Research Organization, Ibaraki (Japan)
- 3. Institute of Industrial Science, University of Tokyo, Tokyo (Japan)
Description
A high-energy and large-object-spot type cylindrical mirror analyzer (CMA) was constructed with the aid of electron trajectory simulations. By adopting a particular shape for the outer cylinder, an energy resolution of 7% was achieved without guide rings as used in conventional CMAs. Combined with an avalanche photodiode as an electron detector, the K-shell internal conversion electrons were successfully measured under irradiation of synchrotron radiation at 14.4 keV in an energy-resolved and time-resolved manner
Additional details
Identifiers
- DOI
- 10.1063/1.2431754;
Publishing Information
- Journal Title
- Review of Scientific Instruments
- Journal Volume
- 78
- Journal Issue
- 1
- Journal Page Range
- p. 013303-013303.4
- ISSN
- 0034-6748
- CODEN
- RSINAK
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38104511
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- AUGER EFFECT; CYLINDERS; CYLINDRICAL CONFIGURATION; ELECTRON DETECTION; ELECTRON EMISSION; ELECTRONS; ENERGY RESOLUTION; EQUIPMENT; EXCITATION; INTERNAL CONVERSION; IRON; IRRADIATION; K SHELL; KEV RANGE 10-100; PHOTODIODES; SYNCHROTRON RADIATION; THIN FILMS; TIME RESOLUTION; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- BREMSSTRAHLUNG; CHARGED PARTICLE DETECTION; CONFIGURATION; CONVERSION; DECAY; DETECTION; ELECTROMAGNETIC RADIATION; ELECTRON SPECTROSCOPY; ELECTRONIC STRUCTURE; ELEMENTARY PARTICLES; ELEMENTS; EMISSION; ENERGY RANGE; ENERGY-LEVEL TRANSITIONS; FERMIONS; FILMS; KEV RANGE; LEPTONS; METALS; NUCLEAR DECAY; PHOTOELECTRON SPECTROSCOPY; RADIATION DETECTION; RADIATIONS; RESOLUTION; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; SPECTROSCOPY; TIMING PROPERTIES; TRANSITION ELEMENTS
Optional Information
- Notes
- (c) 2007 American Institute of Physics